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Atomic Force Microscopy (AFM)Detailed examination of a disc surface is challenging because the structures are almost beyond the range of optical microscopes and so AFM imaging must be used. |
A new addition is our Dimension 3100 Atomic Force Microscope (AFM) which is used to image optical disc surfaces and semiconductors where the structures are too small for optical microscopes. Next step, Focused Ion Beam (FIB) >> |