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Focused Ion Beam (FIB).At Raw Science we are committed to investment in cutting edge technology. A recent addition to our already extensive range of facilities is a Micrion 9500 Focused Ion Beam system. Focused Ion Beam (FIB) technology is used to effectively 'edit' integrated circuits at gate level. As the name suggests, a beam of Ions are focused onto individual transistors and junctions on the silicon wafer. |
At the point of contact with the target the beam is less than 5 Nanometers in size. By controlling the power of the Ion stream the beam can be used to either cut or add traces to the circuit. FIB is a very powerful tool for the reverse engineer allowing them to actually change the characteristics of the design. In addition, the Micrion 9500 includes a Scanning Electron Microscope producing crystal clear images of semiconductors and optical disc surfaces at 300,000 X magnification. Next step, Cryptography>> |