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| Reverse Engineering Facilities |
| X-Ray Imaging |
| Decapsulation & Examination |
| Micro-Probing & Laser Trimming |
| Atomic Force Microscopy (AFM) |
| Focussed Ion Beam (FIB) |
| Circuit Annotation & Cryptography |
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Micro-Probing and Laser TrimmingMicro probing can help understand a device at gate level. Data captured can be useful to get a clearer picture of a circuit structure. Laser Trimming allows our engineer to actually 'edit' the circuit by cutting traces and even individual transistor junctions. Laser Trimming is useful for some types of tamper proof circuits where the use of other techniques is impossible. |
A Scanning Electron Beam microscope is required for imaging semiconductors Next step, Atomic Force Microscopy (AFM) >> |